MMR可控连续变温霍尔效应测试系统测量半导体薄膜中载流子类型、载流子浓度、迁移率、电阻率、霍尔系数等参数. Ø 温控范围可选 Ø 磁场强度可选
MMR可控连续变温霍尔效应测试系统
测量半导体薄膜中载流子类型、载流子浓度、迁移率、电阻率、霍尔系数等参数.
Ø 温控范围可选
Ø 磁场强度可选
MMR Hall Effect Measurement System
controlled continuously variable temperature
MMR可控连续变温霍尔效应测试系统
Temperature Compact table top design(简洁桌上型设计)
TemperatureRanges Available:70K to 580K80K to 580K70K to 730K80K to 730KRoom temp to 730K
Magnet Ranges Available:5000 Gauss14000 Gauss
Information Provided
Carrier Mobility(载流子迁移率)Carrier Concentration(载流子浓度)Carrier Types (载体类型)n-type or p-type（N型或P型）Resistance Measurements（阻值）Hall Effect of a Magnetic Field(变磁场霍尔)Hall Effect of Temperature(变温霍尔)
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